AZoM on MSN

Advanced Imaging Made Simple with Tabletop SEM

Achieve high quality results with ease using tabletop SEM technology for efficient material analysis.
Semiconductor Engineering

Overview Of 103 Research Papers On Automatic SEM Image Analysis Algorithms For Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
AZOM

Forensic Insights: Analyzing Glass Particles from Smartphone Damage using SEM, EDS, and Micro-CT

Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...
AZoNano

Using SEM for Structural Analysis in Nanomaterials

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
AZoM on MSN

Advanced SEM Imaging in a Space Saving Design

Experience advanced SEM imaging with exceptional clarity and detail, all in a space saving design ideal for labs and research facilities.
AZoNano

SEM Imaging of Nanofiber Morphology and Size Distribution

Nanofibers have gained significant attention for different applications, such as barrier fabrics and high-efficiency filters. In biomedical applications, nanofibers have been used as drug delivery ...
AZoM on MSN

Powerful SEM Technology for the Tabletop

Experience powerful tabletop SEM technology with advanced imaging performance for research, industry, and educational applications.